Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2009-01-21
2010-06-22
Mai, Huy K (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S221000
Reexamination Certificate
active
07740356
ABSTRACT:
A method to encode both high-resolution and low-resolution reflected features of a cornea to improve the measurements for reflection based corneal topography systems. The corneal topography reflective target provides for multiple resolutions of measurements to be obtained from a single acquisition.
REFERENCES:
patent: 5668623 (1997-09-01), Sakurai et al.
patent: 6116738 (2000-09-01), Rorabaugh
patent: 6926408 (2005-08-01), Sarver
Mai Huy K
McHale & Slavin P.A.
Sarver & Associates Inc.
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