Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-21
2006-02-21
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C725S107000, C324S076190
Reexamination Certificate
active
07003414
ABSTRACT:
A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs. Notably, the controller can be configured to compare results from tests with alarm limits, specified in the test plan, to control the spectrum analyzer to perform a failure time spectrum scan when one or more test results exceed one or more alarm limits, and to generate a plot of power amplitude versus frequency over the frequency spectrum of the node at issue.
REFERENCES:
patent: 4810898 (1989-03-01), Rocci et al.
patent: 5861882 (1999-01-01), Sprenger et al.
patent: 5953009 (1999-09-01), Alexander
patent: 6061393 (2000-05-01), Tsui et al.
patent: 6201384 (2001-03-01), Alexander
patent: 6230326 (2001-05-01), Unger et al.
patent: 6385773 (2002-05-01), Schwartzman et al.
patent: 6453472 (2002-09-01), Leano et al.
patent: 6522987 (2003-02-01), Flink et al.
patent: 6546557 (2003-04-01), Ovadia
patent: 6570913 (2003-05-01), Chen
patent: 6574797 (2003-06-01), Naegeli et al.
patent: 6590587 (2003-07-01), Wichelman et al.
patent: 6643607 (2003-11-01), Chamberlain et al.
patent: 6662135 (2003-12-01), Burns et al.
patent: 6707474 (2004-03-01), Beck et al.
patent: 6711134 (2004-03-01), Wichelman et al.
patent: 6732061 (2004-05-01), Wichelman et al.
patent: 6741947 (2004-05-01), Wichelman et al.
patent: 6757908 (2004-06-01), Vogel
patent: 6775840 (2004-08-01), Naegel et al.
patent: 6853932 (2005-02-01), Wichelman et al.
patent: 6895043 (2005-05-01), Naegeli et al.
patent: 487306 (1992-05-01), None
Chamberlain Craig
Flink Eric N.
Votipka Bruce
Wichelman James
Agilent Technologie,s Inc.
Gutierrez Anthony
Hoff Marc S.
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