Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1997-05-29
1999-09-07
Peeso, Thomas R.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
H04B 1700
Patent
active
059501430
ABSTRACT:
A method of monitoring a system includes providing a representative structure of the system which has a plurality of levels in a pyramidal form and selecting a part of the system which is at a level that is not a bottom most level of the pyramidal structure and which has a plurality of sections. A first section of the part of the system is chosen and the said part of the system and its sections are displayed in a graphical manner in a first panel of a display. The said first section is displayed in a second panel of the display, with a symbol in the first panel representing the said first section being shown in a differentiated manner to other graphical components representing the said part. The invention also extends to an arrangement for monitoring a system.
REFERENCES:
patent: 5463775 (1995-10-01), Dewitt et al.
Blake Anthony Vincent
Candy Richard Brodrick Charles
Eskom
Peeso Thomas R.
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