Monitored burn-in system

Details Monitored burn-in system Monitored burn-in system

1992-02-18

1993-04-20

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, 371 221, G01R 3128, G01R 3102

Patent

active

052046184

ABSTRACT:
The invention relates to a monitored burn-in system for operating a group of semiconductor devices such as ICs under an accelerated aging condition. To automatically and appropriately determine the burn-in duration, the disclosed system includes a counting means to count a cumulative number of failed devices at predetermined time intervals, a computing means to compute a cumulative failure rate of the devices at the same time intervals and further compute an increment of the cumulative failure rate during each of the time intervals, and a comparison and control means to compare the computed increment of the cumulative failure rate with a predetermined reference increment of cumulative failure rate and produce a command signal to terminate the burn-in procedure when the computed increment is not greater than the reference increment.

REFERENCES:
patent: 4145620 (1979-03-01), Dice
patent: 4683424 (1987-07-01), Cutright et al.
patent: 4866714 (1989-09-01), Adams et al.

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