Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-03-31
1997-12-02
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
372 36, 385 25, G01R 3128, H01S 304, G02B 636
Patent
active
056940483
ABSTRACT:
An optical subassembly for monitoring the emission of a semi-conductor laser is disclosed. The subassembly is diced from a wafer having mounted thereon the devices to be tested as well as the testing optical devices. The devices of the wafer are burned-in and those sections of the wafer having lasers that pass the burn-in testing are diced and form the subassemblies of the present invention.
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Boudreau Robert A.
Han Hongtao
Roff Robert Wallace
Wilson Randall Brian
Bowser Barry C.
Francos W.
Karlsen Ernest F.
The Whitaker Corporation
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