Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2011-06-14
2011-06-14
Brunsman, David M (Department: 1732)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S716000, C208S111010, C208S111150, C208S136000, C208S143000, C208S31000R
Reexamination Certificate
active
07959899
ABSTRACT:
This invention relates to a crystalline molecular sieve having, in its as-synthesized form, an X-ray diffraction pattern including d-spacing maxima at 13.18±0.25 and 12.33±0.23 Angstroms, wherein the peak intensity of the d-spacing maximum at 13.18±0.25 Angstroms is at least as great as 90% of the peak intensity of the d-spacing maximum at 12.33±0.23 Angstroms. This invention also relates to a method of making thereof.
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Kerby Michael C.
Roth Wieslaw J.
Weston Simon C.
Yorke Thomas
Brunsman David M
ExxonMobil Chemical Patents Inc.
Feng Xiaobing
Tyus Darryl M.
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