Molecular sieve composition (EMM-10-P), its method of...

Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern

Reexamination Certificate

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C423S716000, C208S111010, C208S111150, C208S136000, C208S143000, C208S31000R

Reexamination Certificate

active

07959899

ABSTRACT:
This invention relates to a crystalline molecular sieve having, in its as-synthesized form, an X-ray diffraction pattern including d-spacing maxima at 13.18±0.25 and 12.33±0.23 Angstroms, wherein the peak intensity of the d-spacing maximum at 13.18±0.25 Angstroms is at least as great as 90% of the peak intensity of the d-spacing maximum at 12.33±0.23 Angstroms. This invention also relates to a method of making thereof.

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