Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2007-07-13
2010-11-30
Brunsman, David M (Department: 1793)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S704000, C423S708000, C560S352000, C588S005000, C588S312000, C588S312000, C585S258000, C585S407000, C585S467000, C585S475000, C585S654000
Reexamination Certificate
active
07842277
ABSTRACT:
This disclosure relates to a crystalline MCM-22 family molecular sieve composition having, in its as-synthesized form, an X-ray diffraction pattern including a peak at d-spacing maximum of 12.33±0.23 Angstroms, a distinguishable peak at a d-spacing maximum between 12.57 to about 14.17 Angstroms and a non-discrete peak at a d-spacing maximum between 8.8 to 11. Angstroms, wherein the peak intensity of the d-spacing maximum between 12.57 to about 14.17 Angstroms is less than 90% of the peak intensity of the d-spacing maximum at 12.33±0.23 Angstroms. This disclosure also relates to methods of making the crystalline MCM-22 family molecular sieve composition.
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U.S. Appl. No. 60/834,030, filed Jul. 28, 2006, Inventor: Wieslaw J.Roth, et al., entitled, Molecular Sieve Composition (EMM-10-P).
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De Clerck Els C.
Johnson Ivy D.
Mertens Machteld M.
Roth Wieslaw J.
Brunsman David M
ExxonMobil Chemical Patents Inc.
Feng X.
Tyus D. M.
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