Molecular contamination control system

Coating apparatus – Gas or vapor deposition

Patent

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Details

206710, 206711, 206454, 414217, 414291, 414935, 141 98, 141 85, 141383, B65B 104, B65D 8530, C23C 1600

Patent

active

060426519

ABSTRACT:
The system and method for molecular contamination control permits purging a SMIF pod to desired levels of relative humidity, oxygen, or particulates. The SMIF pod includes an inlet port including a check valve and filter assembly for supplying a clean, dry gaseous working fluid to maintain low levels of moisture, oxygen, and particulate content around materials contained in the SMIF pod. The SMIF pod outlet port, which also includes a check valve and filter assembly, is connected with an evacuation system. Flow of purge gas inside the SMIF pod can be directed with one or more nozzle towers to encourage laminar flow inside the pod, and one or more outlet towers, having a function similar to that of the inlet tower, may also be provided. The purge gas can be dried by exposure to a desiccant, heated to temperatures between about 100.degree. C. and about 120.degree. C., and can be tested for baseline constituent levels prior to or after introduction into a SMIF pod. Multiple SMIF pods can also be purged by a single contamination control base unit.

REFERENCES:
patent: 4616683 (1986-10-01), Tullis et al.
patent: 4705444 (1987-11-01), Tullis et al.
patent: 4724874 (1988-02-01), Parikh et al.
patent: 4728389 (1988-03-01), Logar
patent: 4745088 (1988-05-01), Inoue et al.
patent: 4804086 (1989-02-01), Grohrock
patent: 4863561 (1989-09-01), Freeman et al.
patent: 4957781 (1990-09-01), Kanegae et al.
patent: 5032545 (1991-07-01), Doan et al.
patent: 5169272 (1992-12-01), Bonora et al.
patent: 5252133 (1993-10-01), Miyazaki et al.
patent: 5255783 (1993-10-01), Goodman et al.
patent: 5277579 (1994-01-01), Takanabe
patent: 5320218 (1994-06-01), Yamashita et al.
patent: 5354198 (1994-10-01), Yates
patent: 5373806 (1994-12-01), Logar
patent: 5433574 (1995-07-01), Kawano et al.
patent: 5469963 (1995-11-01), Bonora et al.
patent: 5482161 (1996-01-01), Williams et al.
patent: 5536320 (1996-07-01), Ushikawa et al.
patent: 5575081 (1996-11-01), Ludwig
patent: 5611452 (1997-03-01), Bonora et al.
patent: 5735961 (1998-04-01), Shimada
patent: 5740845 (1998-04-01), Bonora et al.
patent: 5810062 (1998-09-01), Bonora et al.
patent: 5879458 (1999-03-01), Roberson et al.
International Serach Report Re PCT/US97/14969.

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