Moire interferometry system and method with extended imaging dep

Details Moire interferometry system and method with extended imaging dep Moire interferometry system and method with extended imaging dep

1997-07-22

1998-11-10

Nelms, David C.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356374, 250237G, G01B 902

Patent

active

058352180

ABSTRACT:
A moire interferometry system and method are provided for achieving full field surface contouring with an extended depth of view of image. The moire interferometry system includes a projection system generally made up of a light source, imaging lens and a square wave grating pattern. The imaging lens is configured to filter higher order light rays passing through the square wave grating pattern so as to project a sine wave like pattern onto a desired surface. The moire interferometry system also includes a viewing system generally made up of an imaging lens, a submaster grating and a camera. The submaster grating is preferably a customized grating that may be produced by recording a grating pattern in relation to a reference surface. The camera is able to view an image anywhere within the extended depth of image and analyze the moire fringes. A determination of deviation between a test part and a reference surface provides a part inspection system.

REFERENCES:
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
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patent: 5069548 (1991-12-01), Boehnlein
patent: 5075562 (1991-12-01), Greivenkamp, Jr.
patent: 5307152 (1994-04-01), Boehnlein et al.
"Analysis of Rotating structures using image derotation with multiple-pulsed lasers and moire techniques", J.C. MacBain, W. Stange, Kevin Harding, Optical Engineering, vol. 21, No. 3, pp. 474-477, (May/Jun. 1982).
"Moire Interferometry for Industrial Inspection", Kevin Harding, Lasers & Applications, pp. 73-78, (Nov., 1983).
"Phase Grating Use in Moire Interferometry", Kevin Harding and Steven Cartwright, Applied Optics, vol. 23, No. 10, pp. 1517-1520 (May 1984).
"Optical Examination of Highly Curved Structures", Kevin Harding, SPIE, vol. 814 Photomechanics and Speckle Metrology, pp. 406-412 (1987).
"Phase Grating Use for Slope Discrimination in Moire Contouring", Kevin Harding, SPIE, vol. 1614, Optics, illumination and Image Sensing for Machine Vision, VI, pp. 265-270 (1991).
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Patent Abstracts of Japan, vol. 6, No. 248 (P-160) & JP, A, 147003 (Nippon Demki K.K.), Dec. 7, 1992, Sep. 10, 1982.

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