Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-08-22
2006-08-22
Bella, Matthew C. (Department: 2627)
Image analysis
Applications
Manufacturing or product inspection
C345S055000, C345S087000, C382S141000, C382S275000
Reexamination Certificate
active
07095883
ABSTRACT:
A method for inspecting a display panel includes capturing images of a portion of a plurality of display panels having display elements with an image acquisition device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moiré artifact pattern, combining the images of the portion of the plurality of display panels to form a reference image including a Moiré artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with the image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements, the sample image including a sample Moiré artifact pattern, combining the sample image with the reference image to inhibit the sample Moiré artifact pattern from the sample image, and to form a test image, determining defects in display elements in the portion of the sample display panel by inspecting the test image, and determining whether to reject the sample display panel in response to the defects in the display elements.
REFERENCES:
patent: 5307152 (1994-04-01), Boehnlein et al.
patent: 5764209 (1998-06-01), Hawthorne et al.
patent: 5917935 (1999-06-01), Hawthorne et al.
patent: 6075893 (2000-06-01), Brandstetter et al.
patent: 6362802 (2002-03-01), Fujiwara et al.
patent: 6717661 (2004-04-01), Bernstein et al.
patent: 6831995 (2004-12-01), Asano et al.
Crnatovic Aleksander
Hawthorne Jeffrey A.
Leerentveld Ray
Pratt William K.
Safaee-Rad Reza
Bella Matthew C.
Desire Gregory
Photon Dynamics, Inc.
Townsend and Townsend / and Crew LLP
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