Module inspection fixture

Details Module inspection fixture Module inspection fixture

2007-09-11

2007-09-11

Hu, Shouxiang (Department: 2811)

Optical: systems and elements

Compound lens system

Microscope

C359S391000, C356S237400, C356S237500

Reexamination Certificate

active

11067846

ABSTRACT:
An apparatus for inspecting semiconductor module packages which includes a cylindrical base section, a truncated spherical section superimposed on the cylindrical base capable of being rotated and tilted on the cylindrical base section, and a tray section superimposed on the truncated section.

REFERENCES:
patent: 4365779 (1982-12-01), Bates et al.
patent: 4887904 (1989-12-01), Nakazato et al.
patent: 5024415 (1991-06-01), Purens
patent: 5973776 (1999-10-01), Matsushita
patent: 2003/0223111 (2003-12-01), Lamvik et al.

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