Module and apparatus for measuring temperature properties of an

Details Module and apparatus for measuring temperature properties of an Module and apparatus for measuring temperature properties of an

1997-07-22

1999-10-26

Nguyen, Hoa T.

Excavating

365201, G11C 2900

Patent

active

059716061

ABSTRACT:
A module and apparatus for measuring temperature related properties of an SRAM IC includes circuitry for controlling writing of data to and reading of data from a pair of SRAM ICs, one of which is a control and the other of which is the SRAM IC being tested. The circuitry includes an address counter, a logic controller, two input buffers, two output data latches, and a data comparator, the effect of temperature on data input through the input buffers under control of the logic controller and address counter being analyzed by comparing data output through the data latches. In addition, the apparatus includes two separate seats for the respective SRAM ICs, one of which is subjected to a constantly controlled temperature and the other of which is subjected to a varying ambient temperature.

REFERENCES:
patent: 4843608 (1989-06-01), Fu et al.
patent: 4996691 (1991-02-01), Wilcox et al.
patent: 5185722 (1993-02-01), Ota et al.
patent: 5717608 (1998-02-01), Jensen et al.

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