Modular test probe

Details Modular test probe Modular test probe

1981-06-30

1985-03-19

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106

Patent

active

045062153

ABSTRACT:
A test probe employing a buckling beam array for testing integrated circuits. A pair of identical sets of guides are positioned on either side of a centerpost to align the buckling beams. In one embodiment the holes in one set of guides is offset by a key to induce prebow in the beams. In another embodiment prebow is induced by a floating asymmetric separator positioned on the centerpost between the guide sets. When a force is applied to the probe, the beams deflect in the direction but to different extents so that a uniform force is applied to the surface of the IC irrespective of variations in height.

REFERENCES:
patent: 4423376 (1983-12-01), Byrnes et al.
Faure, L. H.; "Contact Probe . . . "; IBM Tech. Dis. Bull.; vol. 19; No. 4; Sep. 1976; pp. 1267-1268.
Dombroski et al; "Floating Bias . . . "; IBM Tech. Dis. Bull.; vol. 18; No. 4; pp. 1038-1039; Sep. 1975.
Cummins et al; "Fabrication of a Cast Epoxy Guide"; IBM Tech. Dis. Bull.; vol. 16; No. 5; Oct. 1973; pp. 1606-1607.
Till, A. W.; "Column Contact Probe"; IBM Tech. Dis. Bull.; vol. 12; No. 4; Sep. 1969; p. 551.

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