Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-02-05
2000-05-16
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 3102
Patent
active
06064219&
ABSTRACT:
A multi chip module with a substrate having a network of a plurality of electrical interconnects and a number of electronic components mounted to the substrate and connected to the network. A monolithic test chip having a number of identical functional regions is mounted to the substrate and electrically connected to the network. Each functional region on the test chip is independently connected to the substrate and is electrically isolated from the others. The chip may be produced by preparing wafers with a grid of identical functional elements, and cutting up the wafers into chips of different sizes, depending on the application.
REFERENCES:
patent: 5313158 (1994-05-01), Joosten
patent: 5602492 (1997-02-01), Cresswell
Ballato Josie
Langlotz Bennet K.
Lenihan Thomas F.
Sundaram T. R.
Tektronix Inc.
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