Modular socket for testing an integrated circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S765010

Reexamination Certificate

active

06914445

ABSTRACT:
A modular socket is designed to facilitate the testing of an integrated circuit and is formed of a base unit, an interposer, a POGO pin unit, and an adapter unit. The base unit is provided with a plurality of contact terminals which are electrically connected with the interposer. The interposer is provided with a plurality of pin holes for holding a plurality of elastic pins of the POGO pin unit such that one end of the elastic pins is extended into an integrated circuit seat of the adapter unit, thereby enabling the pins of the integrated circuit to be electrically connected with the contact terminals via the elastic pins in conjunction with the interposer. The modular socket is versatile in design in that it can be used for the testing of integrated circuit of various specifications.

REFERENCES:
patent: 5940278 (1999-08-01), Schumacher
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6489790 (2002-12-01), An et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Modular socket for testing an integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Modular socket for testing an integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Modular socket for testing an integrated circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3392582

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.