Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-10-07
2000-08-01
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3122
Patent
active
060972009
ABSTRACT:
A system (10) for performing semiconductor reliability tests is disclosed including an oven (36) having open axial ends for slideably receiving a board (12). The board (12) includes an oven region (16) which is removably received in the oven (36) and which is located intermediate connection and exterior regions (14, 18) located axially outside of the oven (36). A temperature sensor (30) is positioned in the oven region (16) and its calibration device (32) is located in the exterior region (18). Contacts (34) on the axial free edge of the connection region (14) are slideably received in an electrical connector (72). The board (12) is formed of low heat transfer material so that the connection and exterior regions (14, 18) and the electrical connector (72) is not heated by the oven (36) and includes a handle (22) on the axial free edge of the exterior region (18). The heat transfer element (38) of the oven (36) has a large thermal mass and is in close and uniform proximity to the DUTs (28) received on the board (12).
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Benjamin Richard
Harry Brent
McMullen Timothy
Turlapaty Venu
Aetrium Incorporated
Kamrath Alan
Nguyen Vinh P.
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