Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1990-02-22
1992-10-06
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356244, 250339, G01B 902, G01N 2101
Patent
active
051536757
ABSTRACT:
A modular optical system for a Fourier transform infrared spectrometer which has a baseplate assembly with a baseplate having a top surface and two mirrors mounted to focus at a point above the baseplate. At least two pins extend upwardly from the baseplate top surface and are fixed with respect to the foci of the mirrors. An accessory module has a flat bottomed positioning plate with portions defining pin holes to coincide with the pins of the face plate. A sample holding accessory platform extends from the positioning plate and is fixed with respect to the pin holes so that when the pin holes of the positioning plate are positioned over the pins of the baseplate and the positioning plate bottom surface is engaged with the locator pads on the baseplate, the sample is located at the foci of the mirrors. Three accessory module guides are located on the baseplate having spring-mounted retainer balls accurately spaced a common distance from the surface of the baseplate which engage beveled chamfers in the sides of the positioning plate and hold the accessory module in place. A sample to be analyzed may be placed in the accessory module and positioned in the FTIR spectrometer by hand, requiring no tools to accurately position the sample.
REFERENCES:
patent: 3806259 (1974-04-01), Boomstrom et al.
patent: 4120592 (1978-10-01), Fleming et al.
patent: 4640617 (1987-02-01), Hughes et al.
patent: 4657390 (1987-04-01), Doyle
patent: 4799001 (1989-01-01), Burch
patent: 4810092 (1989-03-01), Avth
patent: 4847878 (1989-07-01), Badeau
Wilks Scientific Corporation Data Sheet, Nov. 5, 1968.
Hantis K. P.
Nicolet Instrument Corporation
Willis Davis L.
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