Modular design for an IC testing burn-in oven

Details Modular design for an IC testing burn-in oven Modular design for an IC testing burn-in oven

1993-07-15

1999-03-09

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3100

Patent

active

058805923

ABSTRACT:
A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides high voltage low amperage power to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.

REFERENCES:
patent: 4145620 (1979-03-01), Dice
patent: 4468616 (1984-08-01), Yoshizaki
patent: 4866714 (1989-09-01), Adams et al.
patent: 4900948 (1990-02-01), Hamilton
patent: 5086271 (1992-02-01), Haill et al.
patent: 5103168 (1992-04-01), Fuoco

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