Modifying a semiconductor device to provide electrical...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C438S017000

Reexamination Certificate

active

10379178

ABSTRACT:
A method of modifying a semiconductor device to provide electrical parameter monitoring. The device includes a semiconductor die and a package substrate. The substrate includes a conductive plane. The die is connected to the plane via a plurality of connection structures. The method includes disconnecting a first one of the connection structures from the plane, and connecting the first connection structure to an external package connection, thereby providing a capability to monitor an electrical parameter of the die via the external package connection.

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Combined Great Britain Search and Examination Report mailed Aug. 6, 2004 (3 pgs.).
German Office Action mailed Apr. 3, 2006 (5 pgs.).

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