Modified Foucault method for uniquely profiling an imaging devic

Details Modified Foucault method for uniquely profiling an imaging devic Modified Foucault method for uniquely profiling an imaging devic

1990-05-31

1991-06-11

Evans, F. L.

Optics: measuring and testing

Lens or reflective image former testing

For optical transfer function

G01B 900

Patent

active

050227530

ABSTRACT:
A novel method for quantitatively assessing an imaging device in terms of the classical encircled energy test is disclosed in a contemporaneously filed Application. The present invention complements this capability, and discloses a method which can specify, precisely and uniquely, those discrete portions of an imaging device which pass the encircled energy test, and those discrete portions of the imaging device which fail the encircled energy test. Advantages of the present invention include a capability to direct efficient correction procedures towards those discrete portions of the imaging device which fail the encircled energy test, without compromising discrete portions of the imaging device which pass the encircled energy test.

REFERENCES:
patent: 4160598 (1979-07-01), Firester et al.
patent: 4272190 (1981-06-01), Shapiro
patent: 4402602 (1983-09-01), Kuppenheimer, Jr.
patent: 4487502 (1984-12-01), Fantozzi et al.

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