Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-07-18
2006-07-18
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S179000, C702S180000, C702S181000, C702S182000
Reexamination Certificate
active
07079963
ABSTRACT:
A method for a modified binary search includes steps of: selecting a parameter having a distribution of values, selecting a probability density function representative of the distribution of values of the selected parameter, defining a substantially equal probability weighted binary test interval from the probability density function for each of a selected number of test intervals over a selected test range, translating the weighted binary test intervals to obtain a highest resolution at a target point of the selected parameter, and skewing the translated and weighted binary test intervals by a selected scaling function to generate a modified binary test interval for each of the selected number of test intervals over the selected test range.
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Benware Robert
Gloor Cary
Madge Robert
Fitch Even Tabin & Flannery
Hoff Marc S.
Huynh Phuong
LSI Logic Corporation
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