Image analysis – Pattern recognition
Reexamination Certificate
2011-08-02
2011-08-02
Ahmed, Samir (Department: 2624)
Image analysis
Pattern recognition
C382S118000, C382S159000
Reexamination Certificate
active
07991230
ABSTRACT:
Exemplary systems and methods use micro-structure modeling of an image for extracting image features. The micro-structure in an image is modeled as a Markov Random Field, and the model parameters are learned from training images. Micro-patterns adaptively designed from the modeled micro-structure capture spatial contexts of the image. In one implementation, a series of micro-patterns based on the modeled micro-structure can be automatically designed for each block of the image, providing improved feature extraction and recognition because of adaptability to various images, various pixel attributes, and various sites within an image.
REFERENCES:
patent: 5710830 (1998-01-01), Holeva
patent: 6774917 (2004-08-01), Foote et al.
patent: 2003/0122942 (2003-07-01), Parker et al.
patent: 2005078149 (2005-03-01), None
He et a:l “Multiscale Conditional Random Fields for Image Labeling”, 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'04).
Dansereau, et al., “Lip Feature extraction using motion, color, and edge information”, IEEE, 2003, pp. 1-6.
PCT Search Report dated Mar. 8, 2007 relating to Application No. PCT/US2006/040536.
Gong Dian
Tang Xiaoou
Yang Qiong
Ahmed Samir
Lee & Hayes PLLC
Li Ruiping
Microsoft Corporation
LandOfFree
Modeling micro-structure for feature extraction does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Modeling micro-structure for feature extraction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Modeling micro-structure for feature extraction will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2730189