Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate
2006-08-15
2006-08-15
Ferris, Fred (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
C703S002000, C703S006000, C703S014000, C700S028000, C700S029000, C706S010000, C706S012000, C706S023000, C706S025000
Reexamination Certificate
active
07092863
ABSTRACT:
A system for automatic control of a process, comprising a process model using data and further comprising a data model for generating data for said process model and an empirical data extractor for extracting data from said process for said model, and wherein said data used by said process model is interchangeable between data obtained by said data model and data obtained by said extractor. The data model may be a partly statistical partly empirical orthogonal process model. The system is useful in allowing control systems using empirical prediction methods to perform automatic control before having built up a full results database.
REFERENCES:
patent: 4970658 (1990-11-01), Durbin et al.
patent: 5121467 (1992-06-01), Skeirik
patent: 5282261 (1994-01-01), Skeirik
patent: 5325466 (1994-06-01), Kornacker
patent: 5377308 (1994-12-01), Inoue et al.
patent: 5440478 (1995-08-01), Fisher et al.
patent: 5479340 (1995-12-01), Fox et al.
patent: 5483468 (1996-01-01), Chen et al.
patent: 5546507 (1996-08-01), Staub
patent: 5640493 (1997-06-01), Skeirik
patent: 5691895 (1997-11-01), Kurtzberg et al.
patent: 5710700 (1998-01-01), Kurtzberg et al.
patent: 5740033 (1998-04-01), Wassick et al.
patent: 5781430 (1998-07-01), Tsai
patent: 5787425 (1998-07-01), Bigus
patent: 5862054 (1999-01-01), Li
patent: 5875285 (1999-02-01), Chang
patent: 5949678 (1999-09-01), Wold et al.
patent: 6032146 (2000-02-01), Chadha et al.
patent: 6073138 (2000-06-01), de I'Etraz et al.
patent: 6134555 (2000-10-01), Chadha et al.
patent: 6207936 (2001-03-01), de Waard et al.
patent: 6240329 (2001-05-01), Sun
patent: 6249712 (2001-06-01), Boiquaye
patent: 6263255 (2001-07-01), Tan et al.
patent: 6304836 (2001-10-01), Krivokapic et al.
patent: 6373033 (2002-04-01), de Waard et al.
patent: 6381564 (2002-04-01), Davis et al.
patent: 6532454 (2003-03-01), Werbos
patent: 6546522 (2003-04-01), Chen
patent: 6725112 (2004-04-01), Kaminsky et al.
patent: 6766205 (2004-07-01), Williams et al.
patent: 6766283 (2004-07-01), Goldman et al.
patent: 6820070 (2004-11-01), Goldman et al.
patent: 6952688 (2005-10-01), Goldman et al.
patent: 2001/0049595 (2001-12-01), Plumer et al.
patent: 2001/0054032 (2001-12-01), Goldman et al.
patent: WO 00/00874 (2000-01-01), None
“DOE/Opt: A System for Design of Experiments, Response Surface Modeling, and Optimization Using Process of Device Simulation”, D. Boning, IEEE Transactions on Semiconductor Manufacturing, vol. 7, No. 2, May 1994.
“Design of Experiment is the best way to Optimize a Process at Minimal Cost”, S. Kumar, IEEE/CHMT '90 IEMT Symposium, p. 166-173, IEEE 1990.
“A New Methodology of Using Design of Experiments as a Precursor to Neural Networks for Material Processing: Extrusion Die Design”, B. Metha, IEEE 0-7803-5489-Mar. 1999, IEEE 1999.
“Design of Experiments: A Tool for Continous Process Imporvement”.
“Conducting Experiments With Experiment Manager”, M. Angel, pp. 535-541, Proceedings 1996 Winter Simulation Conference ACM 1996.
“Validation of Models: Statistical Techniques and Data Availability”, Kleijnen, Proceedings 1999 Winter Simulation Conference, pp. 647-654, ACM 199.
“Design of Experiments in BDD Variable Ordering: Lessons Learned”, Harlow et al, ICCADA 98', pp. 646-652, ACM 1998.
Constructivist Foundations of Modeling—A Kantian Perspective, Marco C. Bettoni, Internat. Journal of Intelligent Systems, vol. 12, No. 8, Aug. 1998, pp. 577-595.
Knights Technology, Inc. at-a-Glance, http://www.knights.com/ktglance.htm [18-pages].
Work in Progress: Visual Specification of Knowledge Bases, Gavrilova, et al http://www.csa.ru/Inst/gorb—dep/artific/IA/ben-last.htm [8-pages].
Object Space Solutions for a Connected World, http://www.ObjectsSpace.com/products/prodCatalyst.asp [11-pages].
Adventa Corporate Overview, http://www.adventact.com/corporat.htm [28 pages].
Domain Manufacturing, http://www.domainmfg.com/mfg/starfire/industry-specific-auto.htm [10 pages].
HPL Corporate http://www.hpl.com/Corporate/history.htm [6 pages].
SEMY Engineering Home Page http://www.semy.com [9 pages].
KLA-Tencor: Leading the Yield Management Market http://www.tencor.com [15 pages].
Yield Dynamics, Inc. http://www.ydyn.com/products/yield.htm [9 pages].
Artificial Intelligence and Manufacturing: A Research Planning Report, Leslie D. Interrante Aug. 8, 1997, http://sigmans.cs.umn.edu/sigmanwrk/report96.htm [34 pages].
On the Epistemology and Management of Electronic Design Automation Knowledge, Scott et al, http://www.azstarnet.com/'scottmc/medak/Epistermology.htm [17 pages].
Army Medical Knowledge Engineering System (AMKES)—A Three-Tier Knowledge Harvesting Environment, Merritt et al, Practical Applications of Java 1999 Conference Proceedings, http://amzi.harvard.net/articles/amkes—pajava99.htm [7 pages].
Final Model Business Case Report for the OSD CALS IWSDB Project, An MVP Joint Venture, ManTech International Corporation, Dec. 2, 1994, Kidwell et al., http://www2.dcnicn.com/cals/iwsdb/task07/html/a024/Fmodbus1.htm [77 pages].
Computer Aided Knowledge Engineering, British Steel, Mackenzie, http://www.cogsys.co.uk/cake/CAKE-TestSite-BS.htm [12 pages].
Fisher Yossi
Goldman Arnold
Hartman Yehuda
Sarel Shlomo
Ferris Fred
Insyst Ltd.
LandOfFree
Model predictive control (MPC) system using DOE based model does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Model predictive control (MPC) system using DOE based model, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Model predictive control (MPC) system using DOE based model will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3698780