Model based testing for electronic devices

Data processing: structural design – modeling – simulation – and em – Structural design

Reexamination Certificate

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C702S109000

Reexamination Certificate

active

07457729

ABSTRACT:
The model-based method tests compliance of production devices with the performance specifications of a device design. The production devices are manufactured in accordance with the device design by a manufacturing process. In the method, a simple model form based on the device design and the performance specifications is developed, a stimulus for testing the production devices is specified and each production device is tested. The model form has a basis function and model form parameters for the basis function. The model form parameters are dependent on the manufacturing process and differ in value among the production devices. A production device is tested by measuring the response of the production device to the stimulus; extracting, using the model form, the values of the model form parameters for the production device from the measured response and the stimulus; and checking compliance of the production device with the performance specifications using the extracted values of the model form parameters.

REFERENCES:
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patent: 6560568 (2003-05-01), Singhal et al.
patent: 6711723 (2004-03-01), Tsai et al.
patent: 6775646 (2004-08-01), Tufillaro et al.
patent: 2004/0098215 (2004-05-01), Gee et al.
patent: 2006/0026481 (2006-02-01), Monnerat
patent: 2006/0085681 (2006-04-01), Feldstein et al.
Larry Apfelbaum et al. (Model Based Testing, May 1997).

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