MMIC package and interconnect test fixture

Details MMIC package and interconnect test fixture MMIC package and interconnect test fixture

1992-03-10

1993-12-07

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 1910

Patent

active

052686361

ABSTRACT:
A test fixture is provided for determining electrical characteristics such as the S-parameters of a MMIC package or interconnect. The fixture enables the measurement, in effect, of multiple standards using only the single test fixture and also accommodates variable port-to-port spacings. The test fixture comprises a U-shaped conductive ground plane having parallel arms defining a space therebetween. A center conductor is located in the space and is disposed in spaced relationship to the arms of the ground plane. A beam lead PIN diode is connected to the center conductor at one end thereof and to the ground plane at the other. An external variable DC voltage source is used to vary the bias state of the diode so that when the fixture is inserted into a package or interconnect, reflection coefficient measurements for the different bias states can be obtained by an automatic network analyzer for use in calculations for determining the characteristics in question.

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B. D. Geller, "A Broadband Microwave Test Fixture": Microwave Journ. vol. 30, No. 5, May 1987, pp. 233-248.
R. F. Bauer and P. Penfield, "De-embedding and Unterminating", IEEE Transactions on Microwave Theory and Techniques, vol. MTT-22, No. 3, pp. 282-288, Mar. 1974.

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