Mixing manifold for multiple inlet chemistry fluids

Agitating – Having specified feed means – Plural related feeders having separate outlets to mixing...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C366S118000, C366S181500, C366S279000, C366S289000, C366S318000, C366S332000, C366S348000, C451S060000, C451S446000

Reexamination Certificate

active

06632012

ABSTRACT:

BACKGROUND OF THE INVENTION
The general field of technology to which the present invention belongs is wafer manufacture and substrate processing equipment.
Wafers or substrates with exemplary characteristics must first be formed prior to the formation of circuit devices. In determining the quality of the semiconductor wafer, the flatness of the wafer is a critical parameter to customers since wafer flatness has a direct impact on the subsequent use and quality of semiconductor chips diced from the wafer. Hence, it is desirable to produce wafers having as near a planar surface as possible by utilizing polishing and grinding apparatus.
In a current practice, cylindrical boules of single-crystal silicon are formed, such as by Czochralski (CZ) growth process. The boules typically range from 100 to 300 millimeters in diameter. These boules are cut with an internal diameter (ID) saw or a wire saw into disc-shaped wafers approximately one millimeter (mm) thick. The wire saw reduces the kerf loss and permits many wafers to be cut simultaneously. However, the use of these saws results in undesirable waviness of the surfaces of the wafer. For example, the topography of the front surface of a wafer may vary by as much as 1-2 microns (&mgr;) as a result of the natural distortions or warpage of the wafer as well as the variations in the thickness of the wafer across its surface. It is not unusual for the amplitude of the waves in each surface of a wafer to exceed fifteen (15) micrometers. The surfaces need to be made more planar (planarized) before they can be polished, coated or subjected to other processes.
Current substrate polishing technology uses chemical slurry to aid in polishing a substrate. Means for delivering the slurry onto the polishing plate vary for typical chemical mechanical polishing (CMP) techniques. A supplemental alkaline stream is commonly used in addition to the chemical slurry to enhance substrate removal rates during polishing. Unfortunately, one negative side effect of this alkaline stream is that it raises the pH level of the mixture to a level beyond the stability threshold of the silica solution. As a result, colloidal silica particles agglomerate and fall out of the suspension. The particles tend to scratch the wafer during polishing, and in general reduce polishing effectiveness. Hence, improvements are desired to the typical prior art processes.
Additional deficiencies in the current art, and improvements in the present invention, are described below and will be recognized by those skilled in the art.
SUMMARY OF THE INVENTION
In one embodiment of the invention, a manifold for mixing chemistries is provided comprising a plurality of inlets coupled to a manifold interior chamber with each inlet adapted to be coupled to a chemistry line, a mixing element within the chamber, and an outlet coupled to a wafer polishing platen.
The mixing element can take a variety of forms. For example, the mixing element can be shaped, at least partially, in a generally cork screw shape. Furthermore, the mixing element can be a static mixing element. Similarly, an agitator can be used to move the mixing element so as to agitate the mixing element to mix the chemicals.
By injecting the various chemicals into a mixing manifold for near immediate use and delivery to the polishing plate, the present invention reduces or minimizes the time that the chemicals are interacting. As a result, the present invention lessens the time toward instability, which would otherwise occur in the slurry solution.
Other features of the embodiments of the invention will become more fully apparent from the following detailed description, the appended claims, and the accompanying drawings.


REFERENCES:
patent: 4054010 (1977-10-01), Shipman
patent: 4066943 (1978-01-01), Roch
patent: 4149343 (1979-04-01), Feldmeier
patent: 4853286 (1989-08-01), Narimatsu et al.
patent: 4941293 (1990-07-01), Ekhoff
patent: 5056971 (1991-10-01), Sartori
patent: 5173863 (1992-12-01), Martin
patent: 5178461 (1993-01-01), Taniguchi
patent: 5209760 (1993-05-01), Wiand
patent: 5494862 (1996-02-01), Kato et al.
patent: 5549511 (1996-08-01), Cronin et al.
patent: 5567503 (1996-10-01), Sexton et al.
patent: 5582534 (1996-12-01), Shendon et al.
patent: 5679055 (1997-10-01), Greene et al.
patent: 5679212 (1997-10-01), Kato et al.
patent: 5697832 (1997-12-01), Greenlaw et al.
patent: 5733175 (1998-03-01), Leach
patent: 5735731 (1998-04-01), Lee
patent: 5755614 (1998-05-01), Adams et al.
patent: 5800725 (1998-09-01), Kato et al.
patent: 5820449 (1998-10-01), Clover
patent: 5821166 (1998-10-01), Hajime et al.
patent: 5827779 (1998-10-01), Masumura et al.
patent: 5830045 (1998-11-01), Togawa
patent: 5842910 (1998-12-01), Krywanczyk et al.
patent: 5849636 (1998-12-01), Harada et al.
patent: 5851664 (1998-12-01), Bennett et al.
patent: 5851924 (1998-12-01), Nakazawa et al.
patent: 5855735 (1999-01-01), Takada et al.
patent: 5865578 (1999-02-01), Benedikter
patent: 5879222 (1999-03-01), Robinson
patent: 5880027 (1999-03-01), Hajime et al.
patent: 5899743 (1999-05-01), Kai et al.
patent: 5913712 (1999-06-01), Molinar
patent: 5941759 (1999-08-01), Kitajima et al.
patent: 5942445 (1999-08-01), Kato et al.
patent: 5951374 (1999-09-01), Kato et al.
patent: 5963821 (1999-10-01), Kai et al.
patent: 5964646 (1999-10-01), Kassir et al.
patent: 5967882 (1999-10-01), Duescher
patent: 5976260 (1999-11-01), Kinoshita et al.
patent: 5980366 (1999-11-01), Waddle et al.
patent: 5981391 (1999-11-01), Yamada
patent: 5985045 (1999-11-01), Kobayashi
patent: 6036582 (2000-03-01), Aizawa et al.
patent: 6042459 (2000-03-01), Honda
patent: 6046117 (2000-04-01), Bauer et al.
patent: 6050880 (2000-04-01), Kato et al.
patent: 6056631 (2000-05-01), Brown et al.
patent: 6063232 (2000-05-01), Terasawa et al.
patent: 6077149 (2000-06-01), Ohkuni et al.
patent: 6089963 (2000-07-01), Wiand et al.
patent: 6095897 (2000-08-01), Stocker et al.
patent: 6095904 (2000-08-01), Breivogel et al.
patent: 6102784 (2000-08-01), Lichner
patent: 6103636 (2000-08-01), Zahorik et al.
patent: 6114245 (2000-09-01), Vandamme et al.
patent: 6116987 (2000-09-01), Kubo
patent: 6121111 (2000-09-01), Jang et al.
patent: 6132289 (2000-10-01), Labunsky et al.
patent: 6132294 (2000-10-01), Lin
patent: 6149507 (2000-11-01), Lee et al.
patent: 6152806 (2000-11-01), Nystrom
patent: 6156676 (2000-12-01), Sato et al.
patent: 6159827 (2000-12-01), Kataoka et al.
patent: 6162112 (2000-12-01), Miyazaki et al.
patent: 6168506 (2001-01-01), McJunken
patent: 6183352 (2001-02-01), Kurisawa
patent: 6184139 (2001-02-01), Adams et al.
patent: 6184141 (2001-02-01), Avanzino et al.
patent: 6196904 (2001-03-01), Matsuo et al.
patent: 6210259 (2001-04-01), Malkin et al.
patent: 6217433 (2001-04-01), Herrman et al.
patent: 6220949 (2001-04-01), Hayashi et al.
patent: 6224473 (2001-05-01), Miller et al.
patent: 6225136 (2001-05-01), Lydon et al.
patent: 6227944 (2001-05-01), Xin et al.
patent: 6227950 (2001-05-01), Hempel et al.
patent: 6239039 (2001-05-01), Nihonmatsu et al.
patent: 6270392 (2001-08-01), Hayashi et al.
patent: 6270395 (2001-08-01), Towery et al.
patent: 6312320 (2001-11-01), Sato et al.
patent: 6354918 (2002-03-01), Togawa et al.
patent: 6358117 (2002-03-01), Kato et al.
patent: 6358125 (2002-03-01), Kawashima et al.
patent: 6361202 (2002-03-01), Lee et al.
patent: 6376395 (2002-04-01), Vasat
patent: 6391779 (2002-05-01), Skrovan
patent: 6406364 (2002-06-01), Kimura et al.
patent: 6419574 (2002-07-01), Takahashi et al.
patent: 6431959 (2002-08-01), Mikhaylich et al.
patent: 6491836 (2002-12-01), Kato et al.
patent: 0776030 (1997-05-01), None
patent: 0940219 (1999-09-01), None
patent: 1050374 (2000-11-01), None
patent: 61-152358 (1986-07-01), None
patent: 6-295891 (1994-10-01), None
patent: 10-146751 (1998-06-01), None
patent: 10-242088 (1998-09-01), None
patent: 10-256203 (1998-09-01), None
patent: WO 99/09588 (1999-02-01), None
patent: WO 99/31723 (1999-06-01), None
Wilmer et al; PGPUBS document 2002/0048213, published Apr. 2002, filed Jul. 2001, based on provisional application filed Jul. 2000.*
Vog

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mixing manifold for multiple inlet chemistry fluids does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mixing manifold for multiple inlet chemistry fluids, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mixing manifold for multiple inlet chemistry fluids will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3134107

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.