Mixed signal integrated circuits with self-test capability

Details Mixed signal integrated circuits with self-test capability Mixed signal integrated circuits with self-test capability

2008-01-01

2008-01-01

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

10997310

ABSTRACT:
A mixed signal integrated circuit with self test capability in which a portion of the digital circuitry, during substantially mutually exclusive time intervals, controls self test functions within the analog circuitry and performs digital signal processing functions in conjunction with the remaining portion of the digital circuitry.

REFERENCES:
patent: 5506851 (1996-04-01), Fuse
patent: 5793778 (1998-08-01), Qureshi
patent: 6597191 (2003-07-01), Oosawa et al.
patent: 6876220 (2005-04-01), Witte
patent: 6925408 (2005-08-01), Premy et al.
patent: 7096386 (2006-08-01), Ozawa

Affiliated with

Also associated with

Rating

Mixed signal integrated circuits with self-test capability does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mixed signal integrated circuits with self-test capability, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mixed signal integrated circuits with self-test capability will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3935004