Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2006-11-14
2006-11-14
Phan, Thai (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S002000, C327S156000, C716S030000, C714S731000
Reexamination Certificate
active
07136799
ABSTRACT:
A mixed signal delay locked loop characterization technique for automatically characterizing a mixed signal delay locked loop is provided. The technique tests the mixed signal delay locked loop using a top-down approach in order to ensure the robustness of the mixed signal delay locked loop. Top-level testing involves testing the performance of the mixed signal delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the mixed signal delay locked loop.
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Chong Kian
Gauthier Claude R.
Liu Dean
Osha & Liang LLP
Phan Thai
Sun Microsystems Inc.
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