Mitigation of errors in an imaging system with detectors...

Details Mitigation of errors in an imaging system with detectors... Mitigation of errors in an imaging system with detectors...

2011-06-28

2011-06-28

Porta, David P. (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Semiconductor system

Reexamination Certificate

active

07968852

ABSTRACT:
Implementations of the present technology include error mitigation processes that determine gantry angle-dependent measures of detector deflections for a given class of systems using a first method, then determine gantry angle-independent deviations from the class measures using a second method on a specific system; then apply, to the specific system of the second method, the gantry angle-dependent class deflection results of the first method modified by the system-specific gantry angle independent deflections of the second method; and further include a system calibrated by such combinations of processes and computer program products for performing at least portions of the combination of processes.

REFERENCES:
patent: 4385397 (1983-05-01), Verro
patent: 2007/0075250 (2007-04-01), Malmin
Metzler et al., “Measuring the variation in radius of rotation as a function of gantry angle for ultra-high-resolution pinhole SPECT,” 2005, IEEE Transactions on Nuclear Science, vol. 52, No. 5, pp. 1236-1242.

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