MIS-transistor-based nonvolatile memory device for...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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Details

C365S185230, C365S189080

Reexamination Certificate

active

07463519

ABSTRACT:
A nonvolatile semiconductor memory device includes a data input buffer configured to receive data from outside the device, a nonvolatile memory cell including two MIS transistors to store first data received by the data input buffer by creating an irreversible change of transistor characteristics in one of the two MIS transistors, whichever is selected in response to a value of the first data, a sense latch coupled to the nonvolatile memory cell and configured to store the first data obtained by sensing a difference in the transistor characteristics between the two MIS transistors of the nonvolatile memory cell, and a logic circuit configured to produce a signal indicative of comparison between the first data stored in the sense latch and second data received by the data input buffer, wherein no data path to output the first data stored in the sense latch to outside the nonvolatile semiconductor memory device exists.

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