Measuring and testing – Gas analysis
Reexamination Certificate
2006-02-24
2008-03-11
Williams, Hezron (Department: 2856)
Measuring and testing
Gas analysis
Reexamination Certificate
active
07340938
ABSTRACT:
The invention provides hydrogen selective metal-insulator-semiconductor sensors which include a layer of hydrogen selective material. The hydrogen selective material can be polyimide layer having a thickness between 200 and 800 nm. Suitable polyimide materials include reaction products of benzophenone tetracarboxylic dianhydride 4,4-oxydianiline m-phenylene diamine and other structurally similar materials.
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Bastasz Robert J.
Li Dongmei
McDaniel Anthony H.
Medlin J. William
Frank Rodney
Greenlee Winner and Sullivan P.C.
The Regents of the University of Colorado
The United States of America as represented by The United States
Williams Hezron
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