Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2009-02-20
2011-11-08
Tran, Thien F (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S004000, C257S316000
Reexamination Certificate
active
08053749
ABSTRACT:
A memory comprising at least one memory cell operationally connected to a bit line, a source line and a word line. The memory cell comprises a substrate having a first source contact, a second source contact, and a bit contact between the first source contact and the second source contact, a first transistor gate electrically connecting the first source contact and the bit contact and a second transistor gate electrically connecting the bit contact and the second source contact. The word line electrically connects the first transistor gate to the second transistor gate.
REFERENCES:
patent: 2006/0091549 (2006-05-01), Kojima
Carter Andrew
Lu Yong
Rolbiecki Roger Glenn
Campbell Nelson Whipps LLC
Seagate Technology LLC
Tran Thien F
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