Minimum pulsewidth test module on clocked logic integrated circu

Details Minimum pulsewidth test module on clocked logic integrated circu Minimum pulsewidth test module on clocked logic integrated circu

1991-05-30

1992-11-03

Baker, Stephen M.

Excavating

307269, G06F 1124, H03K 5156

Patent

active

051611619

ABSTRACT:
An integrated circuit chip which contains conventional clocked logic circuitry also contains a tester module for determining the minimum pulsewidth at which the clocked logic circuitry will operate. This tester module occupies a very small portion of the chip, yet it is able to generate several different variable width clock pulse sequences in which the pulsewidths range from being large enough for the clocked logic circuitry to properly operate to being too small for proper operation. By passing these sequences through the clocked logic circuitry, the minimum pulsewidth at which that circuitry will operate can be easily determined.

REFERENCES:
patent: 4290022 (1981-09-01), Puckette
patent: 4546269 (1985-10-01), Johnson
IBM Technical Disclosure Bulletin, "Programmable LSSD Clock Generator", vol. 31, No. 2, Jul. 1988, pp. 81-2.

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