Minimizing end boundary resistance in a programmable...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S538000, C257S516000, C438S382000, C438S694000, C700S121000

Reexamination Certificate

active

11070464

ABSTRACT:
A programmable resistor includes a variety of taps. Selection of any of a variety of tap combinations establishes a path through which current will flow, thus, setting the resistance value of the programmable resistor. The programmable resistor minimizes the effects of parasitic end boundary resistances, Rend/w, between contacts and resistive areas by limiting the contribution of the end boundary resistances to 2Rend/w, regardless of the programmed tap combination. By fabricating a contiguous region of impedance material, only the Rend/w end boundary resistances associated with selected taps affect the value of the programmed resistance. A notched tap structure provides predictability of the resistance value of each tap combination. Taps are narrowed to form a notch which establishes a well-defined current flow path, thus providing the resistance predictability. Additionally, notches also allow for a wider contact-resistive area end boundary, thus, further minimizing the parasitic effect of Rend.

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patent: 5567977 (1996-10-01), Jimenez
patent: 6424121 (2002-07-01), Khouri et al.
patent: 6650173 (2003-11-01), Khouri et al.
patent: 6738173 (2004-05-01), Bonthron et al.
patent: 7084483 (2006-08-01), Aitken et al.

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