Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2011-08-16
2011-08-16
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C850S041000, C850S052000, C850S056000, C850S059000, C850S060000, C427S126100, C427S582000, C427S585000, C977S890000, C977S956000
Reexamination Certificate
active
07997125
ABSTRACT:
A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope, and, to this end, is intended to make it possible to detect its deflection in a particularly reliable manner and with high resolution. For this purpose, the spring element contains a basic body which is formed from a matrix containing embedded nanoparticles or defects. The spring element is produced using the principle of local deposition with focused energetic particles or electromagnetic waves or by pyrolytically induced deposition.
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International Search Report dated May 24, 2007.
Huth Michael
Kaya Alexander
Greenberg Laurence A.
Johann Wolfgang Goethe-Universitaet
Larkin Daniel S
Locher Ralph E.
Nanoscale Systems, Nanoss GmbH
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