Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2006-03-28
2006-03-28
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
07019833
ABSTRACT:
A high resolution spectrometer with a large free spectral range comprising an entrance slit for a beam of electromagnetic radiation to be analyzed, a first dispersion device for dispersing the beam to be analyzed into various wavelength components in a first direction, a second dispersion device for dispersing each wavelength component output from the first dispersion device in a second direction, and an imaging device comprising a sensitive detection spectrum surface on which the beam dispersed in the first and second directions is focused, the first dispersion device being an optical filter that varies linearly and has a surface on which the beam to be analyzed is focused, each point on the surface of the filter operating like a pass band filter with a central frequency varying linearly in the first direction.
REFERENCES:
patent: 3447873 (1969-06-01), Keahl et al.
patent: 5420681 (1995-05-01), Woodruff
patent: 5859702 (1999-01-01), Lindblom
patent: 6057925 (2000-05-01), Anthon
patent: 6556301 (2003-04-01), Carter
patent: 2001/0028458 (2001-10-01), Xiao
Agence Spatiale Europeenne
Cohen & Pontani, Lieberman & Pavane
Evans F. L.
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