Electricity: measuring and testing – Using ionization effects
Patent
1997-08-27
2000-02-15
Do, Diep N.
Electricity: measuring and testing
Using ionization effects
324462, 3133631, 31511191, G01L 2132, H05H 1500, H05B 3126
Patent
active
060257237
ABSTRACT:
An ionization gauge including a source of electrons; an open anode defining an anode volume, where the source of electrons is disposed outside the anode volume; a plurality of ion collector electrodes disposed within the anode volume; a plurality of axially extending anode support posts for supporting the open anode, the anode support posts being electrically connected to the open anode; and the plurality of ion collector electrodes being respectively located sufficiently close to the plurality of axially extending anode support posts so as to substantially repel the electrons from the anode support posts.
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J. Vac. Sci. Technol. A12, 568, P.C. Arnold and S.C. Borichevsky, "Nonstable behavior of widely used ionization gauges", pp. 568-573, Apr. 1994.
J. Vac. Sci. Technol. A12, 574, D.G. Bills, "Causes of nonstability and nonreproducibility in widely used Bayard-Alpert ionization gauges", pp. 574-579, Apr. 1994.
J. Vac. Sci. Technol. A12, 580, P.C. Arnold, D.G. Bills, M.D. Borenstein and S.C. Borichevsky, "Stable and reproducible Bayard-Alpert ionization guage", pp. 580-586, Apr. 1994.
Granville-Phillips Series 360 Product Data, "STABIL-ION.RTM. Vacuum Measurement System", Nov. 1996.
Anelva Miniature Gauge Data Sheet (undated).
"Modulated Bayard-Alpert Gauge", P.A. Redhead, Rev. of Sci. Inst., (1960), pp. 343-344 (month unavailable).
Do Diep N.
Ferguson Jr. Gerald J.
Granville-Phillips Company
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