Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1983-04-01
1987-02-10
Levy, Stewart J.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324 95, 128653, G01R 3100
Patent
active
046425586
ABSTRACT:
An electromagnetic field measurement probe for measuring an electromagnetic field and providing a corresponding measurement signal to a measurement output. The electromagnetic field measurement probe comprises an antenna arrangement for detecting the electromagnetic field and producing a corresponding electrical output, and an output connector arrangement connected to the antenna arrangement for providing the corresponding electrical output to the measurement output of the probe. The output connector arrangement includes a lead structure comprising a dielectric having opposing faces on opposite sides thereof, and high resistivity lead material disposed on the opposing faces. The probe further comprises a diode rectifier disposed between and connecting two antenna elements forming the antenna arrangement, as well as two output connector bonding pads, each being electrically connected to the high resistivity material disposed on respective ones of the two opposing faces of the dielectric.
REFERENCES:
patent: 3541473 (1970-11-01), Schlicke et al.
patent: 3794914 (1974-02-01), Aslan
patent: 3931573 (1976-01-01), Hopfer
patent: 4277744 (1981-07-01), Audone et al.
patent: 4317078 (1982-02-01), Weed et al.
Batchman Theodore E.
Gimpelson George E.
Byrne John J.
Kile Bradford E.
Levy Stewart J.
O'Shea Kevin D.
Univ. of Virginia Alumni Patents Found.
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