Miniature circuit processing devices and matrix test heads for u

Details Miniature circuit processing devices and matrix test heads for u Miniature circuit processing devices and matrix test heads for u

1981-11-02

1985-04-09

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 3102, G01R 106

Patent

active

045104450

ABSTRACT:
A matrix test head for miniature circuits is disclosed which consists of a number of rigidly mounted printed circuit boards supporting a plurality of contact probes for contacting test points of miniature circuits.

REFERENCES:
patent: 3185927 (1965-05-01), Margulis et al.
patent: 3334354 (1967-08-01), Mutschler
patent: 3345567 (1967-10-01), Turner et al.
patent: 3437929 (1969-04-01), Glenn
patent: 3600057 (1971-08-01), Leffler
patent: 3731191 (1973-05-01), Bullard et al.
patent: 3768351 (1973-10-01), Stepan
patent: 3930809 (1976-01-01), Evans
patent: 4035723 (1977-07-01), Kvaternik
patent: 4052793 (1977-10-01), Coughlin et al.
IBM Technical Disclosure Bulletin 562000032 Y, Betts et al., vol. 18, No. 9, 2/1976.
Model 1034 Automatic Wafer Prober, Electroglas, Menlo Park, Calif.

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