Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1997-09-09
1999-03-23
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324646, 324644, G01N 2202, G01R 2704
Patent
active
058865349
ABSTRACT:
A millimeter wave sensor is provided for non-destructive inspection of thin sheet dielectric materials. The millimeter wave sensor includes a Gunn diode oscillator (GDO) source generating a mill meter wave electromagnetic energy signal having a single frequency. A heater is coupled to the GDO source for stabilizing the single frequency. A small size antenna is coupled to the GDO source for transmitting the millimeter wave electromagnetic energy signal to a sample material and for receiving a reflected millimeter wave electromagnetic energy signal from the sample material. Ferrite circulator isolators coupled between the GDO source and the antenna separate the millimeter wave electromagnetic energy signal into transmitted and received electromagnetic energy signal components and a detector detects change in both amplitude and phase of the transmitted and received electromagnetic energy signal components.
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"Millimeter Wave Imaging for Nondestructive Evaluation of Materials" Materials Evaluation, vol. 52, No. 3, Mar., 1994, pp. 412-415, by N. Gopalsami, S. Bakhtiari, S. L. Dieckman, A.C. Raptis and M. J. Lepper.
Bakhtiari Sasan
Gopalsami Nachappa
Raptis Apostolos C.
Do Diep N.
The University of Chicago
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