Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Patent
1992-06-17
1994-11-01
Hille, Rolf
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
257428, 359565, 342372, G01T 124, H01L 2714, H01Q 1500
Patent
active
053609735
ABSTRACT:
A non-mechanical beam deflector forms and scans a beam of millimeter wave (MMW) radiation at a rapid rate. The beam deflector includes a semiconductor body in which a spatially varying density of charge carriers is selectively injected. The injected charge carriers--electrons and/or holes--alter the dielectric constant of the semiconductor body locally and thereby attenuate and reflect incident MMW radiation. The portions of the semiconductor body that do not have carriers injected therein allow the incident MMW radiation to be transmitted. The semiconductor body, modified with a spatially varying density of charge carriers, diffracts the radiation which passes through it into a beam. The beam may be scanned across space through selective control of the injected charge carriers. The diffractive conditions can be rapidly re-configured. The spatially varying density of charge carriers may be induced optically into the semiconductor body, or directly injected using opposing p- and n-type contacts forming a p-n junction. A dynamically variable Fresnel zone plate (FZP) represents one application of the invention.
REFERENCES:
patent: 3569997 (1971-03-01), Lehovec
patent: 3790252 (1974-02-01), Pao
patent: 4190811 (1980-02-01), Alcock et al.
patent: 4508431 (1984-04-01), Henshaw
patent: 4541017 (1985-09-01), Feight et al.
patent: 4812756 (1989-03-01), Curtis et al.
patent: 5084707 (1992-01-01), Reits
patent: 5126875 (1992-06-01), Tabuchi
patent: 5157538 (1992-10-01), Soref
Craig, et al.; "Stress Dependence of Contact Potential: The AC Kelvin Method," Rev. Sci. Instrum., vol. 41:2, pp. 258-264 (1970).
Besocke, et al., "Piezoelectric Driven Kelvin Probe for Contact Potential Difference Studies," Rev. Sci. Instrum., vol. 47:7, pp. 840-842 (Jul. 1976).
Wachtel, et al., "New Application of the Kelvin Method Involving the Scanning of the Bucking Voltage", Rev. Sci. Instrum, vol. 51:10, pp. 1421-1423 (Oct. 1980).
Baumgartner, et al.; "Micro Kelvin Probe for Local Work-Function Measurements", Rev. Sci. Instrum., vol. 59:5, pp. 802-805 (May 1988).
Hille Rolf
Innova Laboratories, Inc.
Limanek Robert
LandOfFree
Millimeter wave beam deflector does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Millimeter wave beam deflector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Millimeter wave beam deflector will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1804007