Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1989-03-03
1991-03-26
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 725, 324158F, G01R 100, G01R 104
Patent
active
050032534
ABSTRACT:
Three classes of active probes all with coaxial inputs and coplanar waveguide probe tips are described. A millimeter-wave active probe for generating signals with frequencies above 50 gHz and supplying same to millimeter-wave and ultrafast devices and integrated circuits on-wafer including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections and nonlinear elements are integrated in uniplanar transmission line medium. Also disclosed is a harmonic mixer probe to step down RF received from an integrated circuit to a lower frequency by mixing it with the harmonics of a local oscillator signal. Also disclosed is an S-parameter active probe for on-wafer measurement of the S-parameters of a two port millimeter-wave device or integrated circuit by injecting millimeter-wave frequencies and simultaneously tapping off a portion of the injected signal, the transmitted signal and the reflected signal and stepping all signals down in frequency to a frequency compatible with currently available test equipment such as the HP8510 automatic network analyzer. This is the first and only all-electronic millimeter-wave on-wafer S-parameter measurement device available at present.
REFERENCES:
patent: 2904685 (1959-09-01), Salmet
patent: 3194976 (1965-07-01), Ludwig et al.
patent: 3343069 (1967-09-01), Tsuda
patent: 3402340 (1968-09-01), Ringereide
patent: 3868588 (1975-02-01), Schwartzmann et al.
patent: 4118670 (1978-10-01), Dickens
patent: 4122449 (1978-10-01), Endo
patent: 4155056 (1979-05-01), Cross et al.
patent: 4259743 (1981-03-01), Kaneko et al.
patent: 4348646 (1982-09-01), Newton et al.
patent: 4514022 (1985-04-01), Payne
patent: 4523163 (1985-06-01), Houdart et al.
patent: 4531105 (1985-07-01), Kumar
patent: 4593243 (1986-06-01), Lao et al.
patent: 4660006 (1987-04-01), Fajima et al.
patent: 4742571 (1988-05-01), Letron
patent: 4749949 (1988-06-01), Albin et al.
patent: 4758775 (1988-07-01), Roos
patent: 4758776 (1988-07-01), Griffin
patent: 4791363 (1988-12-01), Logan
patent: 4803419 (1989-02-01), Roos
patent: 4816767 (1989-03-01), Cannon et al.
patent: 4853613 (1989-08-01), Sequeira et al.
"Picosecond Optical Sampling of GaAs Integrated Circuits", by Weingarten et al, IEEE Journal of Quant. Elect., vol. 24, #2, 2/68.
Bloom David M.
Majidi-Ahy Gholamreza
Burns William
Eisenzopf Reinhard J.
Fish Richard C.
The Board of Trustees of the Leland Stanford Junior University
LandOfFree
Millimeter-wave active probe system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Millimeter-wave active probe system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Millimeter-wave active probe system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-619699