Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2009-08-12
2010-12-28
Pham, Ly D (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185140, C365S185180, C365S072000
Reexamination Certificate
active
07859912
ABSTRACT:
A method of operating a non-volatile memory (NVM) cell structure that utilizes gated diode is provided. The cell architecture, utilizing about 4-10 um2 per bit, includes gated diodes that are used to program the cells while consuming low programming current. The cell architecture also allows a large number of cells to be programmed at the same time, thereby reducing the effective programming time per bit. Erase and read mode bias conditions are also provided.
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Hopper Peter J.
Mirgorodski Yuri
Parsa Roozbeh
Dergosits & Noah LLP
National Semiconductor Corporation
Pham Ly D
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