Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1990-07-24
1992-01-21
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324636, 324642, 324639, G01R 2704
Patent
active
050830880
ABSTRACT:
A method for determining the dielectric properties of a test material using a housing with an electrically shielded cavity defined therein to hold test material that surround an electrical conductor. Input and output circuits for coupling microwave energy into and out of the electrical conductor in the cavity are provided, each circuit having a transmission line having a center conductor extending through the housing with a tapping mechanism midstream of the conductor for coupling energy from the center conductor of the input circuit into the electrical conductor and from the electrical conductor to the center conductor of the output circuit. The tapping mechanisms are adjustable to vary the coupling of microwave energy with respect to the electrical conductor. By using power measuring equipment having a characteristic impedance which matches that of the transmission line(s), the line(s) will be flat between the tapping mechanism and the power measuring equipment thus allowing power measurements without use of directional couplers and/or SWR meters.
REFERENCES:
patent: 3401333 (1968-09-01), Thompson
patent: 3510764 (1970-05-01), Heath
patent: 3559043 (1971-01-01), Hyde
patent: 3942107 (1976-03-01), Gerhard
patent: 4277741 (1981-07-01), Faxvog et al.
patent: 4453125 (1984-06-01), Kimura et al.
patent: 4507602 (1985-03-01), Aguirre
patent: 4581574 (1986-04-01), Goodman et al.
patent: 4801862 (1989-07-01), Osaki et al.
patent: 4829233 (1989-05-01), Flemming
patent: 4866370 (1989-09-01), Fleming et al.
patent: 4866371 (1989-09-01), De
patent: 4952916 (1990-08-01), Taplin
IRE MTT, Jul. 1954, "Characteristic Impedance of the Shielded-Strip Transmission Line", by Seymour B. Cohn, pp. 52-57.
Solis Jose M.
Wieder Kenneth A.
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