Thermal measuring and testing – Emissivity determination
Patent
1985-10-16
1987-03-17
Yasich, Daniel M.
Thermal measuring and testing
Emissivity determination
26 1, 219533, 324 585R, 374 45, D06C 700, G01J 500, G01N 2500
Patent
active
046503455
ABSTRACT:
The temperature of a planar material (8) moving down a process path is measured by causing the material to pass through two openings (3,4) made in a waveguide (1) in such a way that the material effectively does not cut the electric field lines present on the walls of the guide (1) and also so the material (8) passes through the guide in a direction generally parallel to the electric field in the propagation mode of the waveguide and through a region of maximum field strength. The temperature of the planar material (8) is determined by measuring the thermal noise emitted by the material (8) as it passes through the slotted waveguide (1). The slots (3,4) for a rectangular waveguide operating in the TE.sub.10 mode are made along the centerline of the two broad sides of the guide.
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"Determining Emissivity" B. Bernard, Instruments & Control Systems, vol. 37, #5, pp. 87-89.
Lapoulle Bertrand
Leroy Yves
Mamouni Ahmed
Rochas Jean-Francois
Van De Velde Jean-Claude
CNRS
Institut Textile de France
Yasich Daniel M.
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