Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1984-12-24
1987-08-11
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 725, 324158F, G01R 106, G01R 3102
Patent
active
046864636
ABSTRACT:
A fixture having a header plate (20) in rectangular shape with a notch (28) on each end and an aperture (22) in the middle defined as a through hole. A plurality of microwave connectors (30) are located on the top surface of the header plate (20) adjacent to the aperture and penetrate through the body with the connector extended contact planar with the bottom. A substrate (32) of dielectric material with a ground plane on one side and a plurality of striplines (34) on the other is attached into a recess peripherally positioned on the bottom side of the aperture (22). The striplines (34) are joined to the connectors (30) on one end and to individual probe needles (38) with angular tips on the other near the midmost point. A centrally located access opening (36) in the substrate (32) allows visual indication of the probe needles (38) for positioning upon node points and inspection points on a microwave semiconductor wafer under test. The device allows a flowpath for microwave signals from the needle tips through the striplines (34) to the connectors (30) for testing purposes.
REFERENCES:
patent: 3560907 (1971-02-01), Heller
patent: 3775644 (1973-11-01), Cotner et al.
patent: 3867698 (1975-02-01), Beltz et al.
patent: 4045737 (1977-08-01), Coberly
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4101824 (1978-07-01), Breedlove et al.
patent: 4195259 (1980-03-01), Reid et al.
patent: 4365195 (1982-12-01), Stegens
"Introducing the World's First Microwave Wafer Probing Equipment"; Cascade Microwave, P.O. Box 2015, Beaverton, OR; 1983; 4 pages.
Bailey et al.; "A Neutron Hardness . . . "; IEEE Transactions on Nuclear Science; vol. NS-23; No. 6; Dec. 1976; pp. 2020-2023.
Van Tuyl et al.; A Manufacturing Process . . . "; IEEE Transactions on Microwave Theory and Techniques; vol. MTT-30; No. 7; Jul. 1982; pp. 935-941.
Anderson Gordon K.
Karlsen Ernest F.
LandOfFree
Microwave probe fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microwave probe fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microwave probe fixture will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-404914