Microwave plasma element sensor

Details Microwave plasma element sensor Microwave plasma element sensor

1998-02-13

1999-06-01

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

G01N 2173

Patent

active

059092777

ABSTRACT:
The apparatus for analyzing a sample gas includes a source of microwave energy directed onto the sample gas to create a plasma. A spectrometer is arranged to receive light from the plasma to identify different elements and/or to determine the concentration of at least one element in the sample gas. In one embodiment, an attached calibration system is provided for calibrating the output of the spectrometer. The calibration system includes a nebulizer apparatus for introducing a controlled amount of at least one element into the sample gas. The apparatus also includes structure adapted to add a swirl component to the plasma gas flow as an aid to plasma confinement. It is also preferred that a pair of electrodes contacting the sample gas be provided for igniting the plasma.

REFERENCES:
patent: 5252827 (1993-10-01), Koga et al.
patent: 5479254 (1995-12-01), Woskov et al.
patent: 5671045 (1997-09-01), Woskov et al.

Affiliated with

Also associated with

Rating

Microwave plasma element sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microwave plasma element sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microwave plasma element sensor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-958429