Microwave measuring apparatus for continuously and without conta

Details Microwave measuring apparatus for continuously and without conta Microwave measuring apparatus for continuously and without conta

1992-03-27

1993-08-31

Strecker, Gerard R.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

324632, 324635, 333219, G01R 2704, H01P 700

Patent

active

052412792

ABSTRACT:
Apparatus for measuring continuously and without contact the thickness of a thin conducting layer on a running insulating support of the fiber or tape kind, wherein the apparatus includes:
a microwave generator associated by coupling means to a resonant cavity comprising a metal wire in the form of a helix which is fixed at its ends to two metal plates, said insulating support being suitable for running substantially along the axis of said helix; and
means for coupling said cavity to a detection device for detecting the transmission factor of said cavity, which factor is directly a function of said thickness, said measurement being performed at constant frequency.

REFERENCES:
patent: 2491418 (1949-12-01), Schlesman
patent: 2548598 (1951-04-01), Feiker
patent: 3401333 (1968-09-01), Thompson
patent: 3710243 (1973-01-01), Keenan
patent: 4571544 (1986-02-01), Walton
patent: 4841223 (1989-06-01), Baum et al.
patent: 4977383 (1990-12-01), Niikanen
IEEE Transactions on Instrumentation and Measurement, Mar. 1, 1974, pp. 100-101; M. A. Rzepecka: "A Microwave System for Measurement of the Diameter of Thin Electric Fibers".
Fossheim et al, "Broadband Tuning of Helical Resonant Cavities", J. Phys. E. Sci. Instrum., vol. 11, Sep. 1978, 892-893.

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