Microwave InP/SiO.sub.2 insulated gate field effect transistor

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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156DIG70, 427 87, 427 89, 427 93, 01L 2978, H01L 2978, H01L 21316

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active

041940210

ABSTRACT:
An InP/SiO.sub.2 insulated gate field effect transistor which exhibits power gain at microwave frequencies is manufactured by using an n-type epitaxial semiconducting InP film on a semi-insulating InP substrate and depositing a pyrolytic silicon dioxide insulating film on the conducting InP film to form the gate insulator.

REFERENCES:
patent: 3700978 (1972-10-01), North et al.
patent: 3821777 (1974-06-01), James
patent: 4033286 (1977-07-01), Chern et al.
patent: 4098923 (1978-07-01), Alberti et al.
Clarke et al., "The Preparation of High Purity Epitaxial InP" Solid State mmunications, vol. 8, No. 14, pp. 1125-1128, 1970.
Messick, "InP/SiO.sub.2 MIS Structure", Journal of Applied Physics, vol. 47, No. 11, Nov. 1976.

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