Microwave examination of semiconductive shields

Details Microwave examination of semiconductive shields Microwave examination of semiconductive shields

1983-11-10

1986-02-18

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 2704

Patent

active

045715440

ABSTRACT:
A method of continuously and uniformly examining a semiconductor shield of an electrical cable. The method includes the step of providing a cavity structure capable of supporting a relatively high order coaxial mode of microwave energy at a relatively high quality factor when the cavity is dielectrically unloaded. Microwave energy is directed to the cavity in a manner that excites the high order mode, and a cable having a semiconductor shield is continuously directed through the cavity structure. The semiconductive material loads the cavity structure and thereby changes the quality factor thereof. The loading of the structure and the changing quality factor thereof are continuously monitored to provide an indication of changes in the integrity of the semiconductive shield.

REFERENCES:
patent: 2548598 (1951-04-01), Feiker, Jr.
patent: 2792548 (1957-05-01), Hershberger
patent: 3233172 (1966-02-01), Luoma
patent: 3458808 (1969-07-01), Agdur
patent: 3739263 (1973-06-01), Henoch
patent: 3995212 (1976-11-01), Ross
patent: 4103224 (1978-07-01), Taro et al.
patent: 4297874 (1981-11-01), Sasaki

Affiliated with

Also associated with

Rating

Microwave examination of semiconductive shields does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microwave examination of semiconductive shields, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microwave examination of semiconductive shields will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1552185